Tag Archives: ICP-OES

ICP-OES: Why spectral lines are true peaks and how this can fool the user.

ICP–OES is a common technique in analytical chemistry, which is characterized by simplicity, simultaneous multi-elemental determination capability, high sensitivity, linear dynamic range, low detection limits, and good precision [1]. It seems to be the perfect method for element analysis (esp. metals). However, sometimes it can fool the user.

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References

  1. K. Satyanarayana, and S. Durani, "Separation and inductively coupled plasma optical emission spectrometric (ICP-OES) determination of trace impurities in nuclear grade uranium oxide", Journal of Radioanalytical and Nuclear Chemistry, vol. 285, pp. 659-665, 2010. http://dx.doi.org/10.1007/s10967-010-0591-8